HyperNex - acquired by Nova Measuring Instruments
HyperNex is a developer of commercial microstructure analysis tools for 300/200 mm semiconductor production lines.
The company began as a research arm of ATMI to pursue semiconductor applications for x-ray diffraction analysis. During that time the company developed several different custom x-ray diffraction systems for on-line and near on-line semiconductor applications, including real-time thin film vapor deposition phase analysis, rapid residual stress analysis, and rapid crystallographic texture analysis.
HyperNex recently incorporated to pursue commercialization of a rapid microstructure analysis tool for 300/200 mm production lines. In February of 2001, the company entered into a joint development effort with a leading US semiconductor company to optimize its diffraction tool for the latest copper manufacturing facilities.
