Imago Upgrades Atom-Probe Microscope
September 1, 2006
Imago Scientific Instruments has released an upgrade to its main product line, the LEAP 3000 microscope. The upgrade offers a mode called "laser-pulse" which enables analysis of semiconductor and other high electrical resistance specimens. The traditional "voltage pulse" function has been used to analyze metallic samples, magnetic materials and other electrically conductive specimens. The addition of the upgrade module will enable research facilities to add a significant component to their capabilities. Learn more about the LEAP microscope and the new upgrade at www.imago.com.
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