Hypernex
Nova Measuring Instruments Acquires Hypernex
Nova Measuring Instruments, Ltd. the marekt leader in integrated metrology and process control for the semiconductor industry announced that it has entered into an Asset Purchase Agreement with HyperNex, Inc. to acquire substantially all the assets of HyperNex in exchange for up to 1.8 million shares of Nova and the assumption of specified liabilities. The transaction is valued at approximately $4.5 million. Assuming the transaction closes in May, HyperNex could account for about 10% of Nova's revenue in 2006. Read more on the HyperNex website.
April 25, 2006 | Permalink
Polycrystalline XRD Method from Hypernex Finds Metal Defects
In an article in Semiconductor International, Alexander E. Braun notes that HyperNex has pursued the development of a quantitative XRD metrology system specifically for fab-level monitoring of polycrystalline phase and texture. The result is a fab system that uses an area detector combined with proprietary wafer motion protocols and XRD analysis algorithms. This combination provides for rapid quantitative phase and texture analysis down to spot sizes as small as 26 ? 35 ?m.
January 13, 2004 | Permalink
Hypernex Receives 2nd PO For Fab System
Hypernex announced that is has received its second purchase order for an AutoTex-200 inspection system, adding additional validity to the HyperNex business model and the need for this type of inspection.
November 1, 2003 | Permalink
Hypernex closes new round
In April, we were the lead investor in a $2.5 round of equity financing for Hypernex, a manufacturer of semiconductor test inspection equipment. We had previously led the company's $2 million funding round in 2001. This round also included investments from Draper Fisher Jurvetson and CID Equity Partners. The press release is available in PDF here.
October 27, 2003 | Permalink
